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Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow. Hosmer, David W., author.

New York : John Wiley & Sons, [1989]
xiii, 307 pages : illustrations ; 24 cm.
http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-t.html
http://www.gbv.de/dms/hbz/toc/ht003527681.pdf
http://swbplus.bsz-bw.de/bsz020434235inh.htm
http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-b.html
http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-d.html


http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-t.html
http://www.gbv.de/dms/hbz/toc/ht003527681.pdf
http://swbplus.bsz-bw.de/bsz020434235inh.htm
http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-b.html
http://catdir.loc.gov/catdir/enhancements/fy0607/89031893-d.html