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Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang.
- 621.395 L445
- Leblebici, Yusuf.
- Kluwer Academic,
- c1993.
- Boston :
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Mathematics across cultures : ǂb the history of non-western mathematics / editor, Helaine Selin ; advisory editor, Ubiratan D'Ambrosio.
- 510.9 M4264a
- Kluwer Academic,
- c2000.
- Dordrecht ; Boston :