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272
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Applied chaos / edited by Jong Hyun Kim, John Stringer.
- 003.7 A6524
- Wiley,
- c1992.
- New York :
-
Statistical models in applied science / Karl V. Bury.
- 519.5 B975
- Bury, Karl V., 1935-
- Wiley,
- c1975.
- New York :
-
Measurement error models / Wayne A. Fuller.
- 519.2 F9654
- Fuller, Wayne A.,
- Wiley,
- [1987] ©1987
- New York :
-
Design and analysis of experiments for statistical selection, screening, and multiple comparisons / Robert E. Bechhofer, Thomas J. Santner, David M. Goldsman.
- 519.38 B391
- Bechhofer, Robert E.
- Wiley,
- [1995] ©1995
- New York :
-
Handbook of the Poisson distribution / Frank A. Haight.
- 519.24 H1498
- Haight, Frank A.,
- Wiley,
- [1967] ©1967
- New York :
-
Univariate discrete distributions / Norman L. Johnson, Samuel Kotz, Adrienne W. Kemp.
- 519.52 J661 1992
- Johnson, Norman Lloyd,
- Wiley,
- [1992] ©1992
- New York :
-
Telecommunication system engineering / Roger L. Freeman.
- 621.382 F8551 1996
- Freeman, Roger L.,
- Wiley,
- [1996] ©1996
- New York :
-
A probabilistic analysis of the Sacco and Vanzetti evidence / Joseph B. Kadane, David A. Schum.
- 347.736021 K115
- Kadane, Joseph B.
- Wiley,
- c1996.
- New York :
-
Conversations at random : survey research as interviewers see it / Jean M. Converse and Howard Schuman ; illustrations by Elizabeth E. Converse.
- 300.723 C7668
- Converse, Jean M., 1927-
- Wiley,
- [1974]
- New York :
-
An introduction to regression graphics / R. Dennis Cook, Sanford Weisberg.
- 519.536078 C7711
- Cook, R. Dennis,
- Wiley,
- New York :