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42
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Pattern recognition and machine learning / Christopher M. Bishop.
- 006.4 B6221p
- Bishop, Christopher M,
- Springer,
- New York :
-
Studies in subjective probability / edited by Henry E. Kyburg, Howard E. Smokler.
- 519.2 S93336s
- John Wiley & Sons,
- New York :
-
Response surfaces : designs and analyses / André I. Khuri, John A. Cornell.
- 519.5 K4595
- Khuri, André I., 1940-
- M. Dekker,
- New York :
-
Probabilités et potentiel / Paul-André Meyer.
- 519.2 M6132
- Meyer, Paul André,
- Hermann,
- [1966] ©1966
- Paris :
-
Variance components / Shayle R. Searle, George Casella, Charles E. McCulloch.
- 519.538 S4393
- Searle, S. R. 1928-
- John Wiley & Sons,
- New York :
-
Introduction to statistics / Frank W. Carlborg.
- 519.5 C2785
- Carlborg, Frank W. 1928-
- Scott, Foresman,
- Glenview, Illinois :
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Matrix algebra useful for statistics / Shayle R. Searle.
- 512.9434 S4393
- Searle, S. R.
- John Wiley & Sons,
- [1982] ©1982
- New York :
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Multidimensional scaling / Joseph B. Kruskal, Myron Wish.
- 300.727 K947
- Kruskal, Joseph B., 1928-
- Sage Publications,
- Beverly Hills, Calif. :
-
Linear models / S.R. Searle.
- 519.5 S4393
- Searle, S. R. 1928-
- John Wiley & sons inc.,
- New York :
-
A guide to physical examination and history taking / Barbara Bates ; with a section on the pediatric examination by Robert A. Hoekelman ; illustrations by Robert Wabnitz and staff, University of Rochester School of Medicine, Susan Shapiro.
- 616.0754 B3291 1987
- Bates, Barbara,
- Lippincott,
- [1987] ©1987
- Philadelphia :