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778
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Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
- 519.536 H827
- Hosmer, David W.,
- John Wiley & Sons,
- New York :
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Applied regression analysis / N.R. Draper, H. Smith.
- 519.536 D765 1981
- Draper, Norman Richard,
- John Wiley & Sons,
- New York :
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Categorical data analysis / Alan Agresti.
- 519.535 A2779c
- Agresti, Alan,
- John Wiley & Sons,
- New York :
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Sampling techniques / William G. Cochran.
- 519.52 C6631 1977
- Cochran, William G. 1909-1980,
- John Wiley & Sons,
- New-York :
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Applied regression analysis / N.R. Draper, H. Smith.
- 519.536 D765 1966
- Draper, Norman Richard,
- John Wiley & Sons,
- New York :
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Linear statistical inference and its applications / C. Radhakrishna Rao.
- 519.5 R2151 1973
- Rao, C. Radhakrishna 1920-
- John Wiley & Sons,
- New York :
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Regression diagnostics : identifying influential data and sources of collinearity / David A. Belsley, Edwin Kuh, Roy E. Welsch.
- 519.536 B4529
- Belsley, David A.,
- John Wiley & Sons,
- New York :
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Practical nonparametric statistics / W.J. Conover.
- 519.53 C753 1980
- Conover, W. J.,
- John Wiley & Sons,
- New York :
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Multiple imputation for nonresponse in surveys / Donald B. Rubin.
- 001.422 R8961
- Rubin, Donald B.,
- John Wiley & Sons,
- New York :
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How to conduct your own survey / Priscilla Salant and Don A. Dillman.
- 300.723 S1611
- Salant, Priscilla,
- John Wiley & Sons,
- New York :