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17
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From fragments to objects [electronic resource] : segmentation and grouping in vision / edited by Thomas F. Shipley, Philip J. Kellman.
- 152.14
- Elsevier,
- 2001.
- Amsterdam ; New York :
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Quaternary glaciations [electronic resource] : extent and chronology / edited by J. Ehlers, P.L. Gibbard.
- 551.79
- Elsevier,
- 2004.
- Amsterdam ; San Diego :
-
Three-dimensional electromagnetics [electronic resource] : proceedings of the second international symposium / edited by Michael S. Zhdanov and Philip E. Wannamaker.
- 622.153
- International Symposium on Three-Dimensional Electromagnetics (2nd : 1999 : Salt Lake City, Utah)
- Elsevier,
- 2002.
- Amsterdam ; New York :
-
Age differences in word and language processing [electronic resource] / edited by Philip A. Allen, Theodore R. Bashore.
- 153
- Elsevier,
- 1995.
- Amsterdam ; New York :
-
L'anglais médical en situation : interrogatoire et examen clinique / François Maniez.
- 610.14 M2781
- Maniez, François.
- Elsevier,
- c2005.
- Paris :
-
Receptor Modeling for Air Quality Management / Edited by Philip K. Hopke.
- 628.53
- Elsevier,
- 1991.
- Amsterdam :
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Nitrogen in the environment [electronic resource] : sources, problems, and management / edited by R.F. Follett and J.L. Hatfield.
- 631.84
- Elsevier,
- 2001.
- Amsterdam ; New York :
-
Échocardiographie Doppler en réanimation, anesthésie et médecine d'urgence / [éd. par] Ph. Vignon, J.P. Goarin ; avec la collab. de J.L. Auffray ... [et al.].
- 616.025 E187
- Elsevier,
- c2002.
- Amsterdam ; New York ; Paris :
-
Ligaments croisés du genou / sous la direction de P. Neyret ; avec la collaboration de T. Aït Si Selmi ... [et al.].
- 617.582059 L7231
- Elsevier,
- c2004.
- Paris :
-
Passivation of metals and semiconductors, and properties of thin oxide layers [electronic resource] : a selection of papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005 / edited by Philippe Marcus and Vincent Maurice.
- 620.11223
- International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers (9th : 2005 : Paris, France)
- Elsevier,
- 2006.
- Amsterdam ; Oxford :