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Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
- 519.536 H827
- Hosmer, David W.,
- John Wiley & Sons,
- New York :
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Foundations of epidemiology / Abraham M. Lilienfeld, David E. Lilienfeld.
- 614.4 L728 1980
- Lilienfeld, Abraham M.,
- Oxford University Press,
- New York :
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Introduction to statistical quality control / Douglas C. Montgomery.
- 658.562 M7871 2001
- Montgomery, Douglas C.,
- John Wiley,
- [2001] ©2001
- New York :
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Case-control studies : design, conduct, analysis / James J. Schlesselman ; with contributions by Paul D. Stolley.
- 614.40727 S342
- Schlesselman, James J.,
- Oxford University Press,
- New York :