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Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
- 519.536 H827
- Hosmer, David W.,
- John Wiley & Sons,
- New York :
-
Introduction to statistical quality control / Douglas C. Montgomery.
- 658.562 M7871 2001
- Montgomery, Douglas C.,
- John Wiley,
- [2001] ©2001
- New York :